E.R. Nowak, M.B. Weissman, et al.
Applied Physics Letters
Electrical noise measurements are reported for magnetic tunnel junctions having magnesium oxide tunnel barriers. These junctions have resistance-area products (RAPs) of order 10-100 M μ m2 and exhibit zero-bias tunneling magnetoresistance ratios (TMRs) as high as 120% at room temperature. The TMR is bias dependent and decreases to half its maximum value for biases near 300 mV. The dominant low-frequency electrical noise is due to resistance fluctuations having a 1f -like power spectral dependence and a nonmagnetic origin. The normalized 1f noise parameter, α, is found to be of order 10-7 to 10-6 which compares favorably to magnetic tunnel junctions consisting of an aluminum oxide barrier with comparable RAPs but lower TMR. At high biases, α is found to decrease which we attribute to defect-assisted tunneling mechanisms. © 2006 American Institute of Physics.
E.R. Nowak, M.B. Weissman, et al.
Applied Physics Letters
E.R. Nowak, R.D. Merithew, et al.
Journal of Applied Physics
E.R. Nowak, P. Spradling, et al.
Thin Solid Films
Weigang Wang, C. Ni, et al.
Physical Review B - CMMP