K.W. Choi, K.Y. Ahn
JVSTA
Review
A comment on "some structure-property relationships in thin magnetic films"
Abstract
No abstract available.
Related
D.R. Campbell, E.I. Alessandrini, et al.
JES
M.L. Yu, K.Y. Ahn, et al.
IBM J. Res. Dev
K.Y. Ahn, S.R. Herd, et al.
JVSTA