K.K. Kim, D. Gupta, et al.
Journal of Applied Physics
The reaction between solid Pt and liquid Hg, at temperatures varying from 20 to 153°C, has been investigated using a combination of gravimetric, x ray, and radioactive tracer techniques in an effort to evaluate the suitability of Pt-Hg contacts for Josephson device packages. The reaction product was identified as Hg4Pt with a lattice parameter of 6.2047 ű0.02%. No penetration of Hg into Pt lattice or grain boundaries has been detected. The kinetic law governing the amalgam formation has been found to be X (cm)=4.48×10-3t exp(-0.52 eV/kT) where X is Pt thickness consumed in the amalgam, t is time in sec, k is Boltzmann constant, and T is temperature. The results indicate that the rate of amalgam formation is controlled by reaction at the Pt-amalgam interface.
K.K. Kim, D. Gupta, et al.
Journal of Applied Physics
S.E. Blum, M.B. Small, et al.
Applied Physics Letters
D. Gupta, K.K. Kim
Journal of Applied Physics
R.D. Thompson, D. Gupta, et al.
Physical Review B