Kaiyuan Zhang, Guanhong Tao, et al.
ICLR 2023
A structure specification scheme is described which can be used to specify the structures of certain two-dimensional patterns. Algorithms are developed to test whether a pattern has a (strongly) well-formed structure with respect to a given structure specification scheme. This method is applicable to the analysis of two-dimensional mathematical expressions and the format of printed material. The usefulness of this method is limited to the analysis of patterns whose structures are based upon a number of operators. When it is applicable, a strongly well-formed structure can be constructed in time n2, where n is the number of primitive components of the pattern. © 1970 American Elsevier Publishing Company, Inc. All rights reserved.
Kaiyuan Zhang, Guanhong Tao, et al.
ICLR 2023
Tessa Lau
AI Magazine
Jorge L.C. Sanz
Pattern Recognition
Yale Song, Zhen Wen, et al.
IJCAI 2013