Investigations of silicon nano-crystal floating gate memories
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
Surface preparation and ion bombardment cleaning of (001) InSb substrates prior to molecular beam epitaxy (MBE) of CdTe films were studied by the combination of various characterization techniques, including X-ray double crystal rocking curves, photoluminescence, Raman scattering and scanning electron microscopy, for different ion bombardment conditions. The optimum substrate preparation conditions of ion bombardment cleaning time and temperature were obtained. The effects of ion beam cleaning on the quality of subsequent MBE CdTe films and the significant divergence among the different assessments are discussed. © 1996 Chapman & Hall.
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Ronald Troutman
Synthetic Metals