Patterning of highly conducting polyaniline films
T. Graham, A. Afzali, et al.
Microlithography 2000
Algorithms for the group testing problem when there is no a priori information on the number of defective items are considered. The efficiency criterion used is the competitive ratio, which is the ratio of the number of tests required by an algorithm when there is no a priori information on the number of defective items, to the number of tests required by an optimal algorithm when the number of defective items is known in advance. A new algorithm is presented, and it is shown that the competitive ratio of this algorithm is 2. This result is an improvement over a previous algorithm due to Du and Hwang (1990) the competitive ratio of which is 2.75. It also proves a conjecture made by Du and Hwang. A new application of group testing techniques for high-speed network is discussed. © 1994.
T. Graham, A. Afzali, et al.
Microlithography 2000
John R. Kender, Rick Kjeldsen
IEEE Transactions on Pattern Analysis and Machine Intelligence
Jonathan Ashley, Brian Marcus, et al.
Ergodic Theory and Dynamical Systems
Da-Ke He, Ashish Jagmohan, et al.
ISIT 2007