Ellen J. Yoffa, David Adler
Physical Review B
Low energy electron microscopy (LEEM) has developed into one of the premier techniques for in situ studies of surface dynamical processes, such as epitaxial growth, phase transitions, chemisorption and strain relaxation phenomena. Over the last three years we have designed and constructed a new LEEM instrument, aimed at improved resolution, improved diffraction capabilities and greater ease of operation compared to present instruments.
Ellen J. Yoffa, David Adler
Physical Review B
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Journal of Physics and Chemistry of Solids
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APS Global Physics Summit 2025
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Langmuir