Richard M. Karp, Raymond E. Miller
Journal of Computer and System Sciences
The running solutions and I-V characteristic of an extended Josephson junction in a state near the ohmic regime are calculated by a perturbation method. Both the voltage-driven and current-driven cases are considered and the convergence of the perturbation procedure is proved. An integral representation of the first correction, in the I-V curve, to the ohmic regime-as well as its dependence on the external magnetic field-is given and evaluated numerically for various values of the junction parameters. © 1979.
Richard M. Karp, Raymond E. Miller
Journal of Computer and System Sciences
Imran Nasim, Michael E. Henderson
Mathematics
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007
James Lee Hafner
Journal of Number Theory