Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
John G. Long, Peter C. Searson, et al.
JES
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997
David B. Mitzi
Journal of Materials Chemistry