David Waltz, Se June Hong
IEEE Intelligent Systems and Their Applications
A simple procedure to produce a minimum length test set for a parity network is presented. If is the largest fan in of any EX-OR gate element in the tree, 2M test patterns are chosen by considering only 2M test sequences, of length 2M, assigned to each signal line. Copyright © 1981 by The Institute of Electrical and Electronics Engineers, Inc.
David Waltz, Se June Hong
IEEE Intelligent Systems and Their Applications
Se June Hong, Sholom M. Weiss
Pattern Recognition Letters
Chidanand Apte, Leora Morgenstern, et al.
IEEE Intelligent Systems and Their Applications
Se June Hong, Ravi Nair
Proceedings of the IEEE