S. Brauer, G.B. Stephenson, et al.
Physical Review Letters
We present a technique for characterizing X-ray sensitive photodiode arrays and charge-coupled device (CCD) arrays. The technique uses simple statistical estimators (means, variances and correlation functions) to determine the response, noise, resolution and detective quantum efficiency of a position-sensitive detector. We apply this technique by characterizing a linear diode array and a CCD array exposed to direct illumination by X-rays. Correlations between neighboring pixels were important, and they are included in the calculation of the detective quantum efficiency and noise of the detector. © 1995.
S. Brauer, G.B. Stephenson, et al.
Physical Review Letters
G.B. Stephenson, K.F. Ludwig Jr., et al.
Review of Scientific Instruments
S. Brauer, G.B. Stephenson, et al.
Review of Scientific Instruments
S.E. Nagler, P.M. Horn, et al.
Physical Review B