D. Gupta
Defect and Diffusion Forum
rf sputter etching has been successful tested for microsectioning and profiling of Au195 radioactive tracer self-diffusion into Au. It was possible to obtain sections of only 50 Å thickness in a reproducible manner and measure extremely small diffusion coefficients. The technique is expected to lend itself universally for diffusion microsectioning. © 1970 The American Institute of Physics.
D. Gupta
Defect and Diffusion Forum
S.K. Lahiri, D. Gupta
Journal of Applied Physics
S.E. Blum, M.B. Small, et al.
Applied Physics Letters
R.T.C. Tsui
Physical Review