D. Gupta
MRS Spring Meeting 1994
rf sputter etching has been successful tested for microsectioning and profiling of Au195 radioactive tracer self-diffusion into Au. It was possible to obtain sections of only 50 Å thickness in a reproducible manner and measure extremely small diffusion coefficients. The technique is expected to lend itself universally for diffusion microsectioning. © 1970 The American Institute of Physics.
D. Gupta
MRS Spring Meeting 1994
D. Gupta, C.-K. Hu, et al.
Defect and Diffusion Forum
D. Gupta, P.S. Ho
Thin Solid Films
D. Gupta
Journal of Applied Physics