Ehud Altman, Kenneth R. Brown, et al.
PRX Quantum
Membrane probe technology represents a significant advance in wafer probing technology over conventional needletype probe cards. We describe several improvements to membrane probes that have been made since their introduction. These include the use of 2-sided metal patterning on the membrane, the introduction of vias thut can be placed anywhere on the membrane, an improved lower inductance power distribution geometry, a process to attach decoupling component!; directly on the membrane within millimeters of the chip pads, an improved force-delivery mechanism and improved membrane-to-PC board microstrip transition. Measured test results on a 512Kb SRAM operating at 200 MHz arc? presented and compared to needle probe results.
Ehud Altman, Kenneth R. Brown, et al.
PRX Quantum
R.B. Morris, Y. Tsuji, et al.
International Journal for Numerical Methods in Engineering
Imran Nasim, Michael E. Henderson
Mathematics
Jianke Yang, Robin Walters, et al.
ICML 2023