Conference paper
Test Structures for Delay Variability
Duane Boning, Joseph Panganiban, et al.
TAU 2002
This paper presents a short-and-update technique for resistors (possibly connected to sinks) that can further crunch the RC network effectively after eliminating internal nodes [1,14]. Our method produces a realizable RC circuit and preserves the total capacitance in the network. While our technique cannot guarantee preserving the Elmore delay at each network sink node, the maximum delay error can be controlled by the user. Our method provides a smooth tradeoff between run time and delay accuracy, ranging from full retention of all resistors to complete elimination.
Duane Boning, Joseph Panganiban, et al.
TAU 2002
Brian A. Floyd, Xiaoling Guo, et al.
TAU 2002