Conference paper
Characterization of a next generation step-and-scan system
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
Paper
An algorithm for solving a polynomic congruence, and its application to error-correcting codes
Abstract
No abstract available.
Related
Zhengxin Zhang, Ziv Goldfeld, et al.
Foundations of Computational Mathematics
Conference paper
Generative Adversarial Symmetry Discovery
Jianke Yang, Robin Walters, et al.
ICML 2023
Ruixiong Tian, Zhe Xiang, et al.
Qinghua Daxue Xuebao/Journal of Tsinghua University