K. Ismail, F. Legoues, et al.
Physical Review Letters
We demonstrate that the thermal diffusivity of thin-film samples bonded to transparent substrates can be measured from the phase lag of thermal waves propagating from the sample surface into the substrate. The thermal waves are detected from the substrate's interferometrically modulated reflectance. This technique is used to determine the thermal diffusivity of 5-μm-thick polymer films.
K. Ismail, F. Legoues, et al.
Physical Review Letters
Ho-Ming Tong, K.L. Saenger
Journal of Applied Polymer Science
K.L. Saenger, G. Costrini, et al.
ECS Meeting 2000
S.J. Koester, J.O. Chu, et al.
MRS Proceedings 2004