William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Statistical experiments have been performed on the photostore to test its reliability as a mass storage system. Errors are analyzed with respect to rate, distribution, and susceptibility to correction by several codes. The experimental results reported are based on disks recorded by optical techniques. Experimental results on disks recorded with electron beams win be reported separately. Copyright © 1968 by The Institute of Electrical and Electronic Engineering, Inc.
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Heinz Koeppl, Marc Hafner, et al.
BMC Bioinformatics
Hendrik F. Hamann
InterPACK 2013
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997