Performance measurement and data base design
Alfonso P. Cardenas, Larry F. Bowman, et al.
ACM Annual Conference 1975
Statistical experiments have been performed on the photostore to test its reliability as a mass storage system. Errors are analyzed with respect to rate, distribution, and susceptibility to correction by several codes. The experimental results reported are based on disks recorded by optical techniques. Experimental results on disks recorded with electron beams win be reported separately. Copyright © 1968 by The Institute of Electrical and Electronic Engineering, Inc.
Alfonso P. Cardenas, Larry F. Bowman, et al.
ACM Annual Conference 1975
Raymond F. Boyce, Donald D. Chamberlin, et al.
CACM
Joel L. Wolf, Mark S. Squillante, et al.
IEEE Transactions on Knowledge and Data Engineering
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering