William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Consider the method of independent replications with initial transient deletion for generating confidence intervals for 'steady-state' quantities. To produce intervals with good convergence characteristics, the relative growth rates of the number of replications, the length of each replication, and the deletion period must be controlled. Critical rates for these parameters are determined. The applicability of these results to simultaneously running multiple replications on a highly parallel computer is discussed. © 1991.
William Hinsberg, Joy Cheng, et al.
SPIE Advanced Lithography 2010
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering
Leo Liberti, James Ostrowski
Journal of Global Optimization