PaperIntrinsic resistivity and electron mean free path in aluminum filmsA.F. MayadasJournal of Applied Physics
PaperElectrical-resistivity model for polycrystalline films: The case of arbitrary reflection at external surfacesA.F. Mayadas, M. ShatzkesPhysical Review B
PaperElectrical characteristics of rf-sputtered single-crystal niobium filmsA.F. Mayadas, R.B. Laibowitz, et al.Journal of Applied Physics
PaperElectrical resistivity model for polycrystalline films: The case of specular reflection at external surfacesA.F. Mayadas, M. Shatzkes, et al.Applied Physics Letters
