PaperLimitations of looped-line scheme for overcoming wired-or glitch effectsD.M. TaubElectronics Letters
PaperAnalysis of line-scan output/e.h.t. generator circuit for c.r.t. displaysD.M. TaubIEE Proceedings G: Electronics Circuits and Systems
PaperAnalysis of Sneak Paths and Sense-Line Distortion in an Improved Capacitor Read-Only MemoryD.M. TaubProceedings of the IEEE