Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
A method for multilevel validation and testing of architectural timing models (timers) coded to predict cycles-per-instruction performance of CMOS RISC processors, is described. Establishment of cause and effect relationships in terms of modal defects and associated fault signatures, verification of steady-state behavior pipeline flow against analytically predicted signatures using a derived application-based test loop kernels and verification of the 'core' parameters of pipeline-level machine organization using derived synthetic test cases, are emphasized.
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Thomas M. Cheng
IT Professional
Kaoutar El Maghraoui, Gokul Kandiraju, et al.
WOSP/SIPEW 2010
György E. Révész
Theoretical Computer Science