Atomic-force microscopy

G. Binnig

doi:10.1088/0031-8949/1987/T19A/008

Physica Scripta

Paper

14 Feb 2007

Atomic-force microscopy

View publication

Abstract

Atomic-Force Microscopy (AFM) is a promising new method for studying the surface structure of both conductors and insulators. Up to now, atomic resolution has been achieved on graphite. © IOP Publishing Ltd.

Paper

Current saturation in submicrometer graphene transistors with thin gate dielectric: Experiment, simulation, and theory

Shu-Jen Han, Dharmendar Reddy, et al.

ACS Nano

Paper

Automated search method for AFM and profilers

Michael Ray, Yves C. Martin

Proceedings of SPIE - The International Society for Optical Engineering

Paper

Catalyst chelation effects in organocatalyzed ring-opening polymerization of lactide

Daniel J. Coady, Amanda C. Engler, et al.

ACS Macro Letters

Conference paper

Characterization of thin dielectric films as copper diffusion barriers using triangular voltage sweep

S. Cohen, J.C. Liu, et al.

MRS Spring Meeting 1999

View all publications

Abstract

Related

Current saturation in submicrometer graphene transistors with thin gate dielectric: Experiment, simulation, and theory

Automated search method for AFM and profilers

Catalyst chelation effects in organocatalyzed ring-opening polymerization of lactide

Characterization of thin dielectric films as copper diffusion barriers using triangular voltage sweep