Conference paper
Performance test case generation for microprocessors
Pradip Bose
VTS 1998
It is possible under favorable circumstances to identify composition, bonding, and electronic structure with atomic resolution in microelectronic device structures. In current device structures, where only a few interface atoms can dominate the performance of a device, this can contribute important understanding relevant to product development. This paper is a brief overview of work in our laboratory using scanning transmission electron microscopy to achieve such capabilities.
Pradip Bose
VTS 1998
Xinyi Su, Guangyu He, et al.
Dianli Xitong Zidonghua/Automation of Electric Power Systems
T.S. Kuan, P.E. Batson, et al.
Journal of Applied Physics
Michael C. McCord, Violetta Cavalli-Sforza
ACL 2007