Conference paper
Compression for data archiving and backup revisited
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
The atomic force microscope (AFM) is a promising new instrument for studying the surface structure of both conductors and insulators. In mapping a graphite surface with an insulating stylus, we have achieved a lateral resolution better than 2.5 Å, although the maximum corrugation amplitude measured is only 0.2 Å. In boron nitride, an insulator, the hexagonal structure with a lattice constant of 2.504 Å is resolved, too. © 1987 Elsevier Science Publishers B.V. (North-Holland Physics Publishing Division).
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
Daniel J. Coady, Amanda C. Engler, et al.
ACS Macro Letters
P.C. Pattnaik, D.M. Newns
Physical Review B
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999