John Kirtley, T.N. Theis, et al.
Physical Review B
Backside optical emission was used to diagnose excess quiescent current in a multimillion gate microprocessor. Emission images showed the current was due to FET's improperly set in a conducting state. The utility of backside optical emission for IC diagnostics is discussed, and requirements for optical detectors and sample preparation are considered.
John Kirtley, T.N. Theis, et al.
Physical Review B
Subramanian S. Iyer, J.C. Tsang, et al.
Applied Physics Letters
J.A. Kash, J.C. Tsang
UEO 1999
J.A. Kash, J.C. Tsang
Journal of Crystal Growth