J.H. Collet, J.A. Kash, et al.
Journal of Physics C: Solid State Physics
Backside optical emission was used to diagnose excess quiescent current in a multimillion gate microprocessor. Emission images showed the current was due to FET's improperly set in a conducting state. The utility of backside optical emission for IC diagnostics is discussed, and requirements for optical detectors and sample preparation are considered.
J.H. Collet, J.A. Kash, et al.
Journal of Physics C: Solid State Physics
J.A. Kash, J.C. Tsang, et al.
CICC 1997
Sudhanshu S. Jha, J.A. Kash, et al.
Physical Review B
B.J. Offrein, C. Berger, et al.
European Symposium on Optics and Photonics for Defence and Security 2005