PaperAutomated search method for AFM and profilersMichael Ray, Yves C. MartinProceedings of SPIE - The International Society for Optical Engineering
Conference paperAn analysis of the effects of miss clustering on the cost of a cache missThomas R. Puzak, A. Hartstein, et al.CF 2007
Conference paperBetter on wafer performance and mask manufacturability of contacts with no or non-traditional serifsDonald Samuels, Ian StobertSPIE Photomask Technology + EUV Lithography 2007
Conference paperHINDCAST OF SOIL MOISTURE USING SMAP, LAND SURFACE MODEL OUTPUT DATA, AND REGRESSION METHODSMaciel Zortea, Miguel Paredes, et al.IGARSS 2021