Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
This paper provides a brief overview of the use of EXAFS in investigating atomic arrangements in amorphous alloys. Comparisons are drawn between EXAFS and scattering techniques, in terms of equations used to analyze the two types of measurements and in terms of results for specific amorphous alloys. Both the promises and the problems of EXAFS for amorphous alloys are discussed. © 1984.
Min Yang, Jeremy Schaub, et al.
Technical Digest-International Electron Devices Meeting
P. Alnot, D.J. Auerbach, et al.
Surface Science
William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films