K.W. Choi, N.J. Mazzeo, et al.
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Paper
Capacitance and ellipsometrically determined oxide thickness of Nb-oxide-Pb Josephson tunnel junctions
Abstract
The capacitance of Nb-oxide-Pb Josephson tunnel junctions was determined from the self-resonance phenomenon in the Josephson.
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