Conference paper
ESD events of cabled GMR sensors
Icko Eric Timothy Iben
EOS/ESD 2010
Capacitance (C) and voltage (V) on a flat disk is calculated as a function of separation (d) from a ground plane. At large d, C and V are constants. C increases as 1/d and V goes to 0 at d=0, eliminating ESD. Adding a contact pin significantly increases ESD risk.
Icko Eric Timothy Iben
EOS/ESD 2010
Icko Eric Timothy Iben, Dylan Boday, et al.
EOS/ESD 2012
Robert G. Biskeborn, Robert E. Fontana, et al.
AIP Advances
Icko Eric Timothy Iben
EOS/ESD 2009