William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron
An epitaxial film of NdNiO3 was investigated by the resonant X-ray scattering technique. Below the metal-to-insulator transition a pronounced energy dependence of the scattering intensity at the Ni K-edge is observed. This is clear evidence for a charge disproportionation on the Ni site, leading to two different electronic Ni ions. The occurrence of a reflection in the σ-π channel, its weakness and its azimuthal dependence together with a symmetry analysis gives clear indications that the observed energy dependence in the σ-σ channel is not due to the asphericity of the Ni 4p shell, but is directly related to the charge disproportionation. © 2003 Elsevier B.V. All rights reserved.
William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron
T.N. Morgan
Semiconductor Science and Technology
David B. Mitzi
Journal of Materials Chemistry
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures