Advanced code coverage analysis using substring holes
Yoram Adler, Eitan Farchi, et al.
ISSTA 2009
Combinatorial Test Design, CTD, does not easily lend itself to the modeling of ordered parameter-values. Such modeling is much needed in practice, e.g. For the testing of sequences of API calls or parameterized events. We extend the CTD paradigm to address this need. We define a test as an ordered tuple of the parameter-values of the model, and introduce the concepts of ordered restrictions and ordered interaction coverage requirements. We develop an efficient algorithm for generating a small set of tests that satisfy the ordered and unordered interaction coverage requirements and evaluate it on several real-life examples. © 2014 IEEE.
Yoram Adler, Eitan Farchi, et al.
ISSTA 2009
Guy Barash, Eitan Farchi, et al.
ESEC/FSE 2019
Samuel Ackerman, Lincoln Alexander, et al.
AI Magazine
Eitan Farchi, Itai Segall, et al.
ICSTW 2013