R. Rajaram, A. Ney, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
We have used Cu Kα radiation to measure both specular reflectivity (000) and longitudinal Bragg diffraction (222) from a Co/Pt multilayer grown by molecular-beam epitaxy on a sapphire (0001) substrate. By refining both low- and high-angle profiles, we are able to separate the effects of surface morphology from microstructure. Our results indicate mixing at the interfaces consistent with the existence of alloy or compound formation.
R. Rajaram, A. Ney, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
T.A. Rabedeau, M. Toney, et al.
Physical Review B
S.S.P. Parkin, R.F.C. Farrow, et al.
Physical Review Letters
N.-H. Cho, Kannan M. Krishnan, et al.
Applied Physics Letters