R. Rajaram, A. Ney, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Paper
Combined low- and high-angle x-ray structural refinement of a Co/Pt(111) multilayer exhibiting perpendicular magnetic anisotropy
Abstract
We have used Cu Kα radiation to measure both specular reflectivity (000) and longitudinal Bragg diffraction (222) from a Co/Pt multilayer grown by molecular-beam epitaxy on a sapphire (0001) substrate. By refining both low- and high-angle profiles, we are able to separate the effects of surface morphology from microstructure. Our results indicate mixing at the interfaces consistent with the existence of alloy or compound formation.
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