Conference paper
Performance test case generation for microprocessors
Pradip Bose
VTS 1998
This paper discusses high availability and disaster recovery solutions and their differences and presents the concepts and technical details of various solutions that combine them for highly critical environments. It discusses the business and regulatory issues that are driving the requirements for these solutions and presents various data center topologies that customers are choosing when implementing 3-site solutions. © Copyright 2008 by International Business Machines Corporation.
Pradip Bose
VTS 1998
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Indranil R. Bardhan, Sugato Bagchi, et al.
JMIS
J.P. Locquet, J. Perret, et al.
SPIE Optical Science, Engineering, and Instrumentation 1998