D.C. Worledge, G. Hu, et al.
IEDM 2010
The ability to electrically characterize submicron magnetic tunnel junctions (MTJ) using a conducting atomic force microscopy (CAFM) was discussed. The brief processing was found to save time and resources, and reduced the potential for damage to the MTJs. The sample requirements, CAFM processing route and the tip preparation were also elaborated.
D.C. Worledge, G. Hu, et al.
IEDM 2010
D.C. Worledge, M. Gajek, et al.
IMW 2012
Joseph Suttle, Neereja Sundaresan, et al.
APS March Meeting 2021
Jonathan Z. Sun, R.P. Robertazzi, et al.
DRC 2011