Conference paper
Recent developments in ST-MRAM, including scaling
Eugene J. O'Sullivan, Martin J. Gajek, et al.
ECS Transactions
The ability to electrically characterize submicron magnetic tunnel junctions (MTJ) using a conducting atomic force microscopy (CAFM) was discussed. The brief processing was found to save time and resources, and reduced the potential for damage to the MTJs. The sample requirements, CAFM processing route and the tip preparation were also elaborated.
Eugene J. O'Sullivan, Martin J. Gajek, et al.
ECS Transactions
David W. Abraham, C.C. Williams, et al.
Journal of Microscopy
H. Wu, V. Katragadda, et al.
IEDM 2021
D.C. Worledge, A. Annunziata, et al.
INTERMAG 2015