M. Loretz, J.M. Boss, et al.
Physical Review X
One of the oldest unresolved problems in physics is the mechanism of charge exchange between contacting surfaces when at least one of them is insulating. We describe a new technique, using force microscopy, for studying this problem with greater lateral resolution than has been previously possible. The force microscope is shown to have 0.2 m lateral resolution and the sensitivity to detect 3 electronic charges. In contact-charging experiments between the microscope tip and polymethyl methacrylate, the charged region was much larger than the expected contact area and bipolar charge exchange was observed. © 1989 The American Physical Society.
M. Loretz, J.M. Boss, et al.
Physical Review X
D. Rugar, P. Grütter
Physical Review Letters
O. Züger, S.T. Hoen, et al.
Journal of Applied Physics
S. Anders, M. Toney, et al.
Journal of Applied Physics