Correlation between J_c and screw dislocation density in sputtered YBa₂Cu₃O_7-δ films

Abstract

Electric transport properties of sputtered YBa2Cu3O7-δ films were studied as a function of screw dislocation density, ranging from 5·107 cm-2 to 1.3·109 cm-2 as determined at the film surface. A correlation was found between the number of screw dislocations and the critical current density (Jc). Films with higher screw dislocation densities have higher critical current densities and a slower drop of Jc as a function of applied magnetic field H. © 1992 Springer-Verlag.