Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
Electric transport properties of sputtered YBa2Cu3O7-δ films were studied as a function of screw dislocation density, ranging from 5·107 cm-2 to 1.3·109 cm-2 as determined at the film surface. A correlation was found between the number of screw dislocations and the critical current density (Jc). Films with higher screw dislocation densities have higher critical current densities and a slower drop of Jc as a function of applied magnetic field H. © 1992 Springer-Verlag.
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
Ellen J. Yoffa, David Adler
Physical Review B
Ronald Troutman
Synthetic Metals
M.A. Lutz, R.M. Feenstra, et al.
Surface Science