PaperThe evolution of optical and electrical properties of low-k dielectrics under bias stressJ.M. Atkin, E. Cartier, et al.Microelectronic Engineering
PaperPolarization of thin phosphosilicate glass films in MGOS structuresJ.M. Eldridge, R.B. Laibowitz, et al.Journal of Applied Physics
PaperMagnetic hysteresis in thin film dc SQUID magnetometersJ.Z. Sun, W.J. Gallagher, et al.Applied Physics Letters