O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
Kinetics and morphology in crystallization of unsupported amorphous silicon films are investigated by hot stage transmission electron microscopy. Crystallization occurs by thermally activated nucleation and growth processes; activation energies of 470 kJ/mol for nucleation and 280 kJ/mol for growth are obtained. Nucleation rates are observed to increase with annealing time, whereas the growth rate depends on the annealing temperature and the crystallographic growth direction. Copyright © 1978 WILEY‐VCH Verlag GmbH & Co. KGaA
O.F. Schirmer, K.W. Blazey, et al.
Physical Review B
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
Ellen J. Yoffa, David Adler
Physical Review B