Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
The recombination time of photoexcited carriers is measured by picosecond luminescence experiments in a GaAs/Ga1-xAlxAs modulation-doped quantum well at low temperature. The electron density is varied in the 0-3×1011 cm-2 range by the use of a Schottky gate. These results, combined with a measurement of the variation of the photoluminescence efficiency, evidence a decrease of the radiative rate and an increase of the nonradiative rate with increasing electron density. © 1989 The American Physical Society.
Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
Frank Stem
C R C Critical Reviews in Solid State Sciences
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
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MRS Proceedings 1983