A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME
The recombination time of photoexcited carriers is measured by picosecond luminescence experiments in a GaAs/Ga1-xAlxAs modulation-doped quantum well at low temperature. The electron density is varied in the 0-3×1011 cm-2 range by the use of a Schottky gate. These results, combined with a measurement of the variation of the photoluminescence efficiency, evidence a decrease of the radiative rate and an increase of the nonradiative rate with increasing electron density. © 1989 The American Physical Society.
A. Nagarajan, S. Mukherjee, et al.
Journal of Applied Mechanics, Transactions ASME
O.F. Schirmer, W. Berlinger, et al.
Solid State Communications
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Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
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MRS Fall Meeting 2020