R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
Direct high-resolution photoetching of various resists and polymers has been demonstrated using an ArF excimer laser at 193 nm. Features as small as 0.3 μm have been produced in 1 μm thick films with no subsequent wet processing steps necessary. © 1984 Springer-Verlag.
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
J.H. Kaufman, Owen R. Melroy, et al.
Synthetic Metals
Ming L. Yu
Physical Review B
R.J. Gambino, N.R. Stemple, et al.
Journal of Physics and Chemistry of Solids