Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
Direct high-resolution photoetching of various resists and polymers has been demonstrated using an ArF excimer laser at 193 nm. Features as small as 0.3 μm have been produced in 1 μm thick films with no subsequent wet processing steps necessary. © 1984 Springer-Verlag.
Sang-Min Park, Mark P. Stoykovich, et al.
Advanced Materials
R.M. Macfarlane, R.L. Cone
Physical Review B - CMMP
J.K. Gimzewski, T.A. Jung, et al.
Surface Science
Shiyi Chen, Daniel Martínez, et al.
Physics of Fluids