A high speed magneto-optic camera system
Mark H. Kryder, A. Deutsch
Proceedings of SPIE 1989
In this letter, a direct measurement of "easy" magnetization switching indicating zero-magnetization remanence in a magnetic probe with a cross section as narrow as 60×60nm2, and as tall as 750 nm, is presented. Magnetic force microscopy was utilized to test focused-ion-beam- fabricated nanomagnetic probes. The data directly indicate that unlike a regular solid probe, a probe with a tubelike ending (nanotube) provides substantially "easier" switching. © 2002 American Institute of Physics. © 2002 American Institute of Physics.
Mark H. Kryder, A. Deutsch
Proceedings of SPIE 1989
Nickolas J. Mazzeo, Ian L. Sanders, et al.
IEEE Transactions on Magnetics
Ian L. Sanders, Mark H. Kryder
Journal of Applied Physics
Mark H. Kryder, Christopher H. Bajorek, et al.
IEEE Transactions on Magnetics