The DX centre
T.N. Morgan
Semiconductor Science and Technology
The graphoepitaxy technique for the registration and alignment of lamellae-forming block copolymers was investigated. The polymer films were spin-coated from 1.5 wt % toluene solutions and then annealed. The film thickness was measured by ellipsometry on flat regions of the wafers and thicker films within the confining grooves were observed. A cross-sectional SEM inspection of the thicker films showed that the block copolymers materials has uniformly covered both the gold features and the gold confining grooves. The target block copolymers morphology was achieved by chemically patterning confining grooves with bottom surface having neutral wetting properties and groove sidewalls wetted by one of the copolymer blocks. It was observed that the thickness of the deposited polymer film also affects the quality with which the modified graphoepitaxy technique aligns lamellar domains.
T.N. Morgan
Semiconductor Science and Technology
Michiel Sprik
Journal of Physics Condensed Matter
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Surendra B. Anantharaman, Joachim Kohlbrecher, et al.
MRS Fall Meeting 2020