O. Krause, Abu Sebastian, et al.
NSTI-Nanotech 2012
We first show the discreteness of source-node and drain-node voltages of individual fins in a multi-fin multi-gate CMOS FET and show their distributions. We then present the discreteness and distributions of individual fin's drain currents, conductances, gate leakage currents, and capacitances.
O. Krause, Abu Sebastian, et al.
NSTI-Nanotech 2012
Ning Lu
ISQED 2008
Ning Lu
NSTI-Nanotech 2008
Young-Hye Na, Jacquana Diep, et al.
NSTI-Nanotech 2012