PaperCorrelation of interface chemistry, barrier height, and step density for Al on vicinal GaAs(100) surfacesS. Chang, I.M. Vitomirov, et al.Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperThermal roughening studied by scanning tunneling microscopyJ.W.M. Frenken, R.J. Hamers, et al.Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
PaperAnnealing effects of anodized Al-based alloy for thin-film transistorsToshiaki Arai, Hideo IiyoriThin Solid Films
PaperPreparation of Pb-Bi film by alloy evaporation II. Microstructure and morphologyH.-C.W. Huang, C.M. SerranoJVSTA