Dissociation kinetics of hydrogen-passivated (100) Si SiO2 interface defects

Paper

01 Jan 1995

Dissociation kinetics of hydrogen-passivated (100) Si SiO₂ interface defects

No abstract available.

Review

David B. Mitzi

Journal of Materials Chemistry

Paper

O.F. Schirmer, K.W. Blazey, et al.

Physical Review B

Paper

R.M. Macfarlane, R.L. Cone

Physical Review B - CMMP

Conference paper

Shaoning Yao, Wei-Tsu Tseng, et al.

ADMETA 2011