DYNAMIC MODULUS MEASUREMENTS AND MATERIALS RESEARCH DYNAMIC MODULUS MEASUREMENTS AND MATERIALS RESEARCH

Abstract

Dynamic modulus measurements are of interest in materials research not only as a source of data on elastic behavior, but also for the insight they provide into structure-property relationships in general. A description is given of a vibrating-reed apparatus which has proved highly adaptable for studies of the elastic and damping behavior of thin-film and other thin-layer electronic materials. Results are reported for amorphous and crystalline ferromagnetic materials, for the high-Tc superconducting oxide Y1Ba2Cu307-x , and for thin films of aluminum and silicon monoxide, to illustrate the important role which the dynamic modulus can play as a tool in materials research.