D.-G. Park, Z. Luo, et al.
VLSI Technology 2004
We show for the first time that electron-energy-loss measurements of atomic absorption are different from the soft-x-ray photoyield data in the region influenced by the core exciton. We suggest that the core-exciton envelope function is influenced by the swift electron and its associated charge-density wake. Solving Schrödingers equation for a model transition potential including the swift electron, we find that the observed differences for SiOx, diamond, and Si can be reproduced. Spectra from aluminum are included as a comparison when the exciton is absent. © 1991 The American Physical Society.
D.-G. Park, Z. Luo, et al.
VLSI Technology 2004
P.E. Batson
Physical Review Letters
P.E. Batson
Ultramicroscopy
M. Breitwisch, T. Nirschl, et al.
VLSI Technology 2007