A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
Injection laser lifetime data are subjected to a simple screening test to identify the longer lived units. The effect this has on the lifetime distribution, and in particular, on the reliability of a system composed of a set of these lasers is considered. © 1980 IEEE
A. Gupta, R. Gross, et al.
SPIE Advances in Semiconductors and Superconductors 1990
David B. Mitzi
Journal of Materials Chemistry
K.A. Chao
Physical Review B
R.W. Gammon, E. Courtens, et al.
Physical Review B