Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
We investigate electrical transport and noise in semiconducting carbon nanotubes. By studying carbon nanotube devices with various diameters and contact metals, we show that the ON-currents of CNFETs are governed by the heights of the Schottky barriers at the metal/nanotube interfaces. The current fluctuations are dominated by 1 / f noise at low-frequencies and correlate with the number of transport carriers in the device regardless of contact metal. © 2006 Elsevier B.V. All rights reserved.
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
J.K. Gimzewski, T.A. Jung, et al.
Surface Science
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
Arvind Kumar, Jeffrey J. Welser, et al.
MRS Spring 2000