Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
We predict a new effect, electron-hole exchange transitions, which occur at all amphoteric defects. We show that these transitions play a dominant role in electron-hole recombination at deep centers. In particular our results demonstrate that recent conflicting data on gold-doped silicon are all consistent with the observed donor and acceptor levels belonging to the same center. © 1985 The American Physical Society.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
M. Hargrove, S.W. Crowder, et al.
IEDM 1998
J. Tersoff
Applied Surface Science
K.N. Tu
Materials Science and Engineering: A